1.
Conference Proceedings
Hayashino,T. ; Taniguchi,Y. ; Yamada,T. ; Shioya,Y. ; Nagao,T. ; Yoshida,T. ; Doi,M. ; Shimasaku,K. ; Komiyama,Y. ; Nakata,F. ; Furusawa,H. ; Kimura,H. ; Ouchi,M. ; Aoki,T. ; Kodaira,K. ; Miyazaki,S. ; Takato,N. ; Yagi,M. ; Yasuda,N.
Pub. info.:
Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany . Part1 pp.397-404, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4008
2.
Conference Proceedings
Miyazaki,S. ; Sekiguchi,M. ; Imi,K. ; Okada,N. ; Nakata,F. ; Komiyama,Y.
Pub. info.:
Optical astronomical instrumentation : 26-28 March, 1998, Kona, Hawaii . Part 1 pp.363-374, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3355
3.
Conference Proceedings
Doi,M. ; Furusawa,H. ; Nakata,F. ; Okamura,S. ; Sekiguchi,M. ; Shimasaku,K. ; Takeyama,N.
Pub. info.:
Optical astronomical instrumentation : 26-28 March, 1998, Kona, Hawaii . Part 2 pp.646-657, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3355