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Active and passive optical components for WDM communications II : 29 July-1 August 2002, Boston, USA. pp.51-62, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61522A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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