1.

Conference Proceedings
Conference Proceedings
1. PHOTOREFLECTANCE CHARACTERISATION OF REACTIVE ION ETCHED SILICON
Murtagh, M. ; Beechinor, J. T. ; Herbert, P. A. F. ; Kelly, P. V. ; Crean, G. M. ; Jeynes, C.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.167-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
2.

Conference Proceedings
Conference Proceedings
2. Anodic sulfidation and model characterisation of GaAs(100) in (NH4)2Sx solution
Elbahnasawy, R.F. ; McInerney, J.G. ; Ryan, P. ; Hughes, G. ; Murtagh, M.
Pub. info.: Compound semiconductor surface passivation and novel device processing : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.265-270,  1999.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 573
3.

Conference Proceedings
Conference Proceedings
3. Optical and Electrical Characterization Study of SiCl4 Reactive-Io-Etched GaAs
Murtagh, M. ; Ye, Shu-Ren ; Masterson, H. J. ; Beechinor, J. T. ; Crean, G. M. ; Auret, F. D. ; Deenapanray, P. N. K. ; Mayer, W. E. ; Goodman, S. A. ; Myburg, G.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.75-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
4.

Conference Proceedings
Conference Proceedings
4. Electrical Characterization of Defects Introduced During Plasma-Based Processing of GaAs
Auret, F. D. ; Myburg, G. ; Meyer, W. E. ; Deenapanray, P. N. K. ; Nordhoff, H. ; Murtagh, M. ; Ye, Shu-Ren ; Masterson, H. J. ; Beechinor, J. T. ; Crean, G. M.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.51-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
5.

Conference Proceedings
Conference Proceedings
5. Optical and Electrical Characterisation of Plasma Processed n-GaAs
Murtagh, M. ; Herbert, P. A. F. ; Kelly, P. V. ; Crean, G. M.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.327-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
6.

Technical Paper
Technical Paper
6. Development and Validation of a Forklift Truck Powertrain Simulation.
Murtagh, M. ; Kee, R. ; McCullough, G. ; Stuart, C. ; Bradley, C.
Pub. info.: 2013 SAE world congress : technical paper.  2013.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2013