New frontiers of processing and engineering in advanced materials : proceedings of the International Conference on New Frontiers of Process Scinence and Engineering in Advanced Materials : The 14th Iketani Conference, November, 24-26, 2004, held in Kyoto, Japan. pp.517-522, 2005. Zuerich, Switzerland. Trans Tech Publications
Fullerenes 2000 : chemistry and physics of fullerenes and carbon nanomaterials, proceedings of the International Symposium. pp.89-99, 2000. Pennington, N.J.. Electrochemical Society
Otaki, K. ; Zhu, Y. ; Ishii, M. ; Nakayama, S. ; Murakami, K. ; Gemma, T.
Pub. info.:
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.182-190, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.145-154, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Murakami, K. ; Hino, M. ; Hiramatsu, M. ; Osamura, K. ; Kanadani, T.
Pub. info.:
Aluminium alloys 2006 : research through innovation and technology : proceedings of the 10th International Conference on Aluminium Alloys, Vancouver, Canada, July 9th-13th, 2006. pp.759-764, Uetikon-Zuerich. Trans Tech Publications
Sugisaki, K. ; Okada, M. ; Zhu, Y. ; Otaki, K. ; Liu, Z. ; Kawakami, J. ; Ishii, M. ; Saito, J. ; Murakami, K. ; Hasegawa, M. ; Ouchi, C. ; Kato, S. ; Hasegawa, T. ; Suzuki, K. ; Yokota, H. ; Niibe, M. ; Takeda, M.
Pub. info.:
Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.59210D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Murakami, K. ; Itoh, H. ; Tohmiya, Y. ; Takita, K. ; Masuda, K.
Pub. info.:
Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A.. pp.167-172, 1984. New York. North-Holland
Nakamura, K. G. ; Ishioka, K. ; Kitajima, M. ; Murakami, K.
Pub. info.:
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.229-, 1997. Pittsburg, Pa.. MRS - Materials Research Society
Murakami, K. ; Fukata, N. ; Sasaki, S. ; Ishioka, K. ; Nakamura, K. G. ; Kitajima, M. ; Fujimura, S. ; Kikuchi, J. ; Haneda, H.
Pub. info.:
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.269-, 1997. Pittsburgh, Penn. MRS - Materials Research Society