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16 results

Conference Proceedings

1. Stress-induced effects in semiconducting epitaxial layers

Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Kaniewski,J. ; Adamczewska,J. ; Trela,J. ; Reginski,K. ; Dobosz,D. ; Prujszczyk,M. ; Tedenac,J.C.

Pub. info.:	International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland. pp.262-266, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4413

Conference Proceedings

2. Visible photoluminescence from Ge+-ion-implanted SiSxNy annealed under hydrostatic pressure

Tyschenko,I.E. ; Zhuravlev,K.S. ; Vandyshev,E.N. ; Misiuk,A. ; Yankov,R.A. ; Rebohle,L. ; Skorupa,W.

Pub. info.:	International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland. pp.237-241, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4413

Conference Proceedings

3. Effect of stress exerted by Si3N4 and SiO2 insulation layers on donor generation in surface layer of Czochralski-grown silicon

Jung,W. ; Misiuk,A. ; Bak-Misiuk,J. ; Rozental,M.

Pub. info.:	Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland. pp.218-221, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3725

Conference Proceedings

4. Photoluminescence studies of Czochralski-grown silicon pressure-annealed at<1000 K

Misiuk,A. ; Surma,H.B.

Pub. info.:	Single crystal growth, characterization, and applications : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland. pp.239-243, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3724

Conference Proceedings

5. Quantum chemical simulation of silicon nanostructures

Dzelme,J. ; Ertsinsh,I. ; Zapol,B. ; Misiuk,A.

Pub. info.:	Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland. pp.116-121, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3725

Conference Proceedings

6. Uniform stress effect on initial stages of oxygen precipitation in Czochralski-grown silicon (Invited Paper)

Misiuk,A.

Pub. info.:	Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland. pp.230-237, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3178

Conference Proceedings

7. X-ray investigation of the relaxation and diffusion behavior of strained SiGe/Si structures under hydrostatic pressure at high temperatures

Zaumseil,P. ; Fischer,G. G. ; Misiuk,A.

Pub. info.:	Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland. pp.172-175, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3179

Conference Proceedings

8. Electrically active defects in Ni-contaminated Cz-Si with oxygen precipitates

Kaminski,P. ; Kozlowski,R. ; Misiuk,A.

Pub. info.:	Metal/Nonmetal Microsystems: Physics, Technology, and Applications. pp.137-140, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2780

Conference Proceedings

9. FTIR study of oxygen precipitation in high-pressure-treated Cz-Si contaminated by transition metals

Surma,B. ; Misiuk,A. ; Mozdzonek,M. ; Hartwig,J. ; Prieur,E.

Pub. info.:	Metal/Nonmetal Microsystems: Physics, Technology, and Applications. pp.160-165, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2780

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Conference Proceedings

10. Peculiarities of the thermal donor formation in Czochralski-grown silicon under high hydrostatic pressure

Emtsev,V.V. ; Emtsev,V.V. ; Oganesyan,G.A. ; Misiuk,A. ; Londos,C.A.

Pub. info.:	International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals. pp.81-84, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4412

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Author: Misiuk,A.