1.

Conference Proceedings
Conference Proceedings
1. Theoretical studies on defects in SiC
Deak,P. ; Gali,A. ; Miro,J. ; Guiterrez,R. ; Sieck,A. ; Frauenheim,Th.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.739-744,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Theoretical Studies on Defects in SiC
Deak,P. ; Gali,A. ; Miro,J. ; Guiterrez,R. ; Sieck,A. ; Frauenheim,Th.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.279-282,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. The NNO Defect in Silicon
Rasmussen,F.Berg ; Oberg,S. ; Jones,R. ; Ewels,C. ; Goss,J. ; Miro,J. ; Deak,P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.791-796,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201