1.

Conference Proceedings
Conference Proceedings
1. Hot-carrier degradation for deep-submicron N-MOSFETs introduced by back-end processing
Lie,D.Y.C. ; Xia,W. ; Yota,J. ; Joshi,A.B. ; Zwingman,R. ; Williams,R. ; Kerametlian,V. ; Cerney,D. ; Min,B.W. ; Kwong,D.L.
Pub. info.: Microelectronic Device Technology : 1-2 October 1997, Austin, Texas.  pp.258-267,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3212
2.

Conference Proceedings
Conference Proceedings
2. Quasi-breakdown in ultrathin dielectrics
Min,B.W. ; Kwong,D.L.
Pub. info.: Microelectronic Device Technology : 1-2 October 1997, Austin, Texas.  pp.80-86,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3212
3.

Conference Proceedings
Conference Proceedings
3. Effects of various RIE process-induced damages on MOSFET characteristics
Min,B.W. ; Han,L.K. ; Joshi,A.B. ; Mann,R. ; Chung,L. ; Kwong,D.-L.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.156-165,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635