1.

Conference Proceedings
Conference Proceedings
1. Finite Element Analysis of the Precracked Line Scratch Test
Volinsky, A.A. ; Mercado, L. ; Sarihan, V. ; Gerberich, W.W.
Pub. info.: Materials science of microelectromechanical systems (MEMS) devices III : symposium held November 27-28, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 657
2.

Conference Proceedings
Conference Proceedings
2. Microstructure and Mechanical Properties of Electroplated Cu Thin Films
Voinsky, A.A. ; Vella, J. ; Adhihetty, I.S. ; Sarihan, V. ; Mercado, L. ; Yeung, B.H. ; Gerberich, W.W.
Pub. info.: Fundamentals of nanoindentation and nanotribology II : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 649
3.

Conference Proceedings
Conference Proceedings
3. Raman and scanning electron microscopy measurements of RDX on glass substrates
Torres, P. ; Mercado, L. ; Mortimer, L. ; Mina, N. ; Hernandez-Rivera, S.P. ; Lareau, R.T. ; Chamberlain, R.T. ; Castro, M.E.
Pub. info.: Detection and Remediation Technologies for Mines and Minelike Targets VIII.  2  pp.1054-1064,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5089