1.

Conference Proceedings
Conference Proceedings
1. Microtexture And Strain In Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D10.3/G7.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
2.

Conference Proceedings
Conference Proceedings
2. Microtexture and Strain in Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A..  pp.G7.3/D10.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 615
3.

Conference Proceedings
Conference Proceedings
3. X-Ray Microbeam Techniques and Applications
Isaacs, E.D. ; Evans-Lutterodt, K. ; Marcus, M.A. ; Macdowell, A.A. ; Lehnert, W. ; Vandenberg, J.M. ; Sputz, S. ; Johnson, J.E. ; Grenko, J. ; Ketelsen, L.J.P. ; Pinzone, C. ; Glew, R. ; Yun, W. ; Cai, Z. ; Rodrigues, W. ; Lee, H.-R. ; Lai, B.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.49-59,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12