In-plane semiconductor lasers IV : 24-25 January 2000, San Jose, California. pp.66-69, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.87-92, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA. pp.303-308, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Coding and signal processing for information storage : 23-24 October, 1995, Philadelphia, Pennsylvania. pp.220-231, 1995. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.31-36, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic sensor technology and applications : 20-22 September 1999, Boston, Massachusetts. pp.348-355, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA. Part1 pp.252-263, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California. pp.143-149, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.860-863, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering