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10 results

Conference Proceedings

1. Non-linear Surface Reaction Kinetics of GaAs MOVPE Explored by Selective Area Growth

H. Song ; M. Sugiyama ; Y. Nakano ; Y. Shimogaki

Pub. info.:	Fundamental Gas-Phase and Surface Chemistry of Vapor-Phase Materials Processing 3. pp.145-156, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(7)

Conference Proceedings

2. Effect of Particle Size Distribution of the Feedstock Powder on the Microstructure of Bulk Metallic Glass Sprayed Coating by HVOF on Aluminum Alloy Substrate

H.G. Kim ; K. Nakata ; T. Tsumura ; M. Sugiyama ; T. Igarashi

Pub. info.:	Advanced welding and micro joining/packaging for the 21st century : selected peer reviewed papers from the International Welding/Joining Conference, Korea 2007 (IWJC, Korea 2007), which was held from 10th-12th May 2007 at COEX, Seoul, Korea. pp.467-470, 2008. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	580-582

Conference Proceedings

3. Post and In Situ Characterization of Strain Control and Crystal Quality in Quantum Well Solar Cell Structure

Y.P. Wang ; M. Deura ; M. Sugiyama ; Y. Nakano

Pub. info.:	Advanced material science and technology : selected, peer reviewed papers from the 7th International Forum on Advanced Material Science and Technology, June 26-28, 2011, Dalian, China (IFAMST-7). pp.73-76, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	675-677

Conference Proceedings

4. Low Temperature Recrystallization of High Purity Iron Severely Deformed by ARB Process

D. Terada ; B. Li ; M. Sugiyama ; N. Tsuji

Pub. info.:	Recrystallization and grain growth III : proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX & GG III, held in Jeju Island, Korea, June 10-15 2007. 558-559 pp.357-362, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	558-559(1)

Conference Proceedings

5. Multi-Scale Analysis of GaAs MOVPE Process by Using Wide-Stripe Selective Area Growth And Computational Fluid Dynamics Simulation

H. Song ; I.-T. Im ; M. Sugiyama ; Y. Nakano ; Y. Shimogaki

Pub. info.:	State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLIII) and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics, and Electronics VI. pp.113-120, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(2)

Conference Proceedings

6. Nitriding Behavior and Strengthening Mechanism of Ti Added Steels

K. Kusumi ; T. Senuma ; M. Suehiro ; M. Sugiyama

Pub. info.:	THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canada. 539-543 pp.4179-4184, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	539-543(5)

Conference Proceedings

7. Mechanical Properties and Change in Microstructure in the Nitriding Process of Cu-Added Steels

K. Kawasaki ; K. Ujita ; J. Takahashi ; M. Sugiyama ; K. Kawakami

Pub. info.:	THERMEC 2009, 6th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS, Berlin, Germany, August 25-29, 2009. pp.852-857, 2010. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	638-642

Conference Proceedings

8. Photo-enhanced MOCVD of Pb(Zr,i)O₃ thin films using O₃

M. Shimizu ; M. Sugiyama ; H. Fujisawa ; T. Shiosaki

Pub. info.:	Second International Conference on Thin Film Physics and Applications : '94 TFPA : 15-17 April 1994, Shanghai, China. pp.478-483, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2364

Conference Proceedings

9. Formulated surface conditioners in 50 nm immersion lithography: simultaneously reducing pattern collapse and line-width roughness

M. Sugiyama ; M. Sanada ; S. Wang ; P. Wong ; S. Sinkwitz ; M. Jaramillo, Jr. ; G. Parris

Pub. info.:	Advances in resist materials and processing technology XXIV. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6519

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Conference Proceedings

10. Post develop stain defect reduction

M. Harumoto ; T. Kuroda ; M. Sugiyama ; A. Hisai

Pub. info.:	Advances in resist materials and processing technology XXV. 2 pp.69233J-1-69233J-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6923

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Author: M. Sugiyama