Bogaerts, W. ; Wiaux, V. ; Dumon, P. ; Taillaert, D. ; Wouters, J. ; Beckx, S. ; Campenhout, J.V. ; Luyssaert, B. ; Thourhout, D.V. ; Baets, R.
Pub. info.:
Nano- and micro-optics for information systems : 3-4 August 2003, San Diego, California, USA. pp.101-112, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering