1.

Conference Proceedings

Conference Proceedings
Kim,H.S. ; Mair,R.A. ; Li,J. ; Lin,J.Y. ; Jiang,H.X.
Pub. info.: Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California.  pp.139-145,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3940
2.

Conference Proceedings

Conference Proceedings
Jiang,H.X. ; Lin,J.Y.
Pub. info.: Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA.  pp.608-621,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3625
3.

Conference Proceedings

Conference Proceedings
Kim,H.S. ; Lin,J.Y. ; Jiang,H.X. ; Chow,W.W. ; Botchkarev,A. ; Morkoc,H.
Pub. info.: Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California.  pp.198-206,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3624
4.

Conference Proceedings

Conference Proceedings
Zhang,J. ; MacPhee,A.G. ; Lin,J.Y. ; Wolfrum,E. ; Nilsen,J. ; Barbee,T.W.,Jr. ; Danson,C.N. ; Key,M.H. ; Lewis,C.L.S. ; Neely,D. ; O'Rourke,R.M.N. ; Pert,G.J. ; Smith,R. ; Tallents,G.J. ; Wark,J.S.
Pub. info.: Soft X-ray lasers and applications II : 28-29 July, 1997, San Diego, California.  pp.53-64,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3156
5.

Conference Proceedings

Conference Proceedings
Tallents,G.J. ; Lin,J.Y. ; Demir,A. ; Behjat,A. ; Smith,R. ; Zhang,J. ; Wolfrum,E. ; Wark,J.S. ; Key,M.H. ; Lewis,C.L.S. ; MacPhee,A.G. ; McCabe,S.P. ; Warwick,P.J. ; Neely,D. ; Healey,S.B. ; Pert,G.J. ; Nickles,P.V. ; Kalachnikov,M.P. ; Schnurer,M.
Pub. info.: Soft X-ray lasers and applications II : 28-29 July, 1997, San Diego, California.  pp.30-41,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3156
6.

Conference Proceedings

Conference Proceedings
Chen,G. ; Smith,M. ; Lin,J.Y. ; Jiang,H.X. ; khan,M.Asif ; Sun,C.J.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.642-643,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
7.

Technical Paper

Technical Paper
Chen,D.T. ; Lin,J.Y. ; Chuah,Y.K. ; Fang,L.J.
Pub. info.: 22nd Intersociety Energy Conversion Engineering Conference : energy - new frontiers : Philadelphia, Pennsylvania, August 10-14, 1987.  pp.1161-1166,  1987.  "Society of Automotive Engineering, Inc."
Title of ser.: SAE publication
Ser. no.: P-198
8.

Conference Proceedings

Conference Proceedings
Dai,L. ; Zhang,B. ; Zhang,Y. ; Wang,R. ; Zhu,X. ; Lin,J.Y. ; Jiang,H.X.
Pub. info.: Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures.  pp.224-231,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3899
9.

Conference Proceedings

Conference Proceedings
Li,J. ; Nam,K.B. ; Kim,K.H. ; Oder,T.N. ; Jun,H.J. ; Lin,J.Y. ; Jiang,H.
Pub. info.: Ultrafast Phenomena in Semiconductors V.  pp.27-35,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4280
10.

Conference Proceedings

Conference Proceedings
Li,J. ; Zeng,K.C. ; Shin,E.J. ; Lin,J.Y. ; Jiang,H.
Pub. info.: Ultrafast Phenomena in Semiconductors V.  pp.70-77,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4280