1.

Conference Proceedings
Conference Proceedings
1. Practical approach for AAPSM image imbalance correction for sub-100-nm lithography
Cho, H.L. ; Lin, S.Y. ; Hsieh, F. ; Kroyan, A. ; Liu, H.-Y. ; Huang, J.H. ; Hsu, S.-H. ; Huang, I-H. ; Lin, B.S.-M. ; Hung, K.-C.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.778-786,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
2.

Conference Proceedings
Conference Proceedings
2. Calibration of OPC models for multiple focus conditions
Schacht, J. ; Herold, K. ; Zimmermann, R. ; Torres, J.A. ; Maurer, W. ; Granik, Y. ; Chang, C.-H. ; Hung, G.K.-C. ; Lin, B.S.-M.
Pub. info.: Optical Microlithography XVII.  pp.691-702,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377