1.

Conference Proceedings
Conference Proceedings
1. Defects spectroscopy in β-Ga2O3
Meyer,B.K. ; Leib,U. ; Hofstaetter,A. ; Krummel,C. ; Kohl,D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1473-1478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Technical Paper
Technical Paper
2. Influence on Materials Flow in Deep Drawing Using Individual Controllable Draw Pins and Smooth Blankholder Design
Neugebauer,R. ; Leib,U. ; Braunlich,H.
Pub. info.: Sheet metal stamping : development applications.  pp.269-274,  1997.  Society of Automotive Engineering, Inc.
Title of ser.: SAE special publication
Ser. no.: SP-1221