1.

Conference Proceedings
Conference Proceedings
1. Expanded nonlinear order dithering and modified error diffusion for an ink-jet color printer
Lee,C.-S. ; Lee,C.-H. ; Park,Y.-W. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts IV : 26-29 January 1999, San Jose, California.  pp.541-550,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3648
2.

Conference Proceedings
Conference Proceedings
2. Characteristics of residual products in HF gas-phase etching of sacrificial oxides for silicon micromachining
Jang,W.-I. ; Choi,C.-A. ; Lee,C.-S. ; Hong,Y.-S. ; Lee,J.-H.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part2  pp.956-963,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
3.

Conference Proceedings
Conference Proceedings
3. Practical methodology of optical proximity correction in subquarter-micron lithography
Lim,C.-M. ; Seo,J.-W. ; Kang,C.-S. ; Park,Y.-S. ; Yoon,J.-T. ; Lee,C.-S. ; Moon,S.-C. ; Kim,B.-H.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.666-674,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679
4.

Conference Proceedings
Conference Proceedings
4. Bandwidth analysis of a microgyroscope vibrating in two orthogonal axes on the substrate plane
Hong,Y.-S. ; Lee,J.-H. ; Lee,C.-S. ; Jang,W.-1. ; Choi,C.-A. ; Kim,S.-H. ; Kwak,Y.-K.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part2  pp.939-947,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
5.

Conference Proceedings
Conference Proceedings
5. Effect of polysilicon interface on stress in multistacked polysilicon films
Choi,C.-A. ; Lee,C.-S. ; jang,W.-1. ; Lee,J.-H. ; Shon,B.K.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part2  pp.1134-1140,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
6.

Conference Proceedings
Conference Proceedings
6. Gamut mapping using variable anchor points
Lee,C.-S. ; Kim,K.-M. ; Lee,E.-J. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts IV : 26-29 January 1999, San Jose, California.  pp.129-139,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3648
7.

Conference Proceedings
Conference Proceedings
7. Compensation of intrafield registration error caused by process properties in optical lithography
Lee,T.-G. ; Moon,S.-C. ; Lee,H.-M. ; Kim,J.-S. ; Lee,C.-S. ; Kim,H.-Y. ; Park,H.-K.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography X.  pp.365-378,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2725