1.

Conference Proceedings
Conference Proceedings
1. Comparison of Reactive Extrusion In Various Twin Screw Extruders and Their Roles On Mixing (130)
Lee,B.H. ; White,J.L.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  3  pp.3794-3798,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
2.

Conference Proceedings
Conference Proceedings
2. Rotating compensator spectroscopic ellipsometry (RCSE) and its application to high-k dielectric film HfO2
Leng,J. ; Li,S. ; Opsal,J.L. ; Aspnes,D.E. ; Lee,B.H. ; Lee,J.C.
Pub. info.: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.228-234,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4099
3.

Technical Paper
Technical Paper
3. Linear Acoustic Design of Silencing System Considering the Acoustic Higher-Order Modes
Ih,J.G. ; Lee,B.H.
Pub. info.: Proceedings of the Fourth International Pacific Conference on Automotive Engineering : Melbourne, Australia, November 8-14, 1987 : mobility, the technical challenge.  pp.197-,  1987.  Warrendale, Pa..  Society of Automotive Engineers
Title of ser.: SAE publication
Ser. no.: P-212
4.

Conference Proceedings
Conference Proceedings
4. Spectrophotometry and beam profile reflectometry measurement of six layers in an SOI film stack
Leng,J.M. ; Sidorowich,J.J. ; Yoon,Y.D. ; Opsal,J.L. ; Lee,B.H. ; Cha,G. ; Moon,J. ; Lee,S.I.
Pub. info.: Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III.  pp.166-172,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2877
5.

Conference Proceedings
Conference Proceedings
5. High-K gate dielectrics
Qi,W.-Y. ; Lee,B.H. ; Nieh,R. ; Kang,L. ; Jeon,Y. ; Onishi,K. ; Lee,J.C.
Pub. info.: Microelectronic Device Technology III.  pp.24-32,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3881