1.

Conference Proceedings
Conference Proceedings
1. Surface Characteristics of the Engineered Polymeric Media for Filtration and Adsorption in Urban Runoff
Kang, S.W. ; Kim, S.K. ; Kim, Y.I. ; Yun, S.L. ; Lee, T.Y.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.718-721,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
2.

Conference Proceedings
Conference Proceedings
2. N-Vinylamides and Reduction of Oxygen Inhibition in Photopolymerization of Simple Acrylate Formulations
Miller, Chris W. ; Hoyle, C.E. ; Joensson, S. ; Nason, C. ; Lee, T.Y. ; Kuang, W.F. ; Viswanathan, K.
Pub. info.: Photoinitiated polymerization.  pp.2-14,  2003.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 847
3.

Conference Proceedings
Conference Proceedings
3. High energy and low jitter picosecond optical pulser for sample-and-hold
Sun, C.K. ; Chang, C.T. ; Massey, G.A. ; Lee, T.Y. ; Yu, R. ; Albares, D.J.
Pub. info.: Photonics and radio frequency II : 21-22 July 1998, San Diego, California.  pp.212-218,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3463
4.

Conference Proceedings
Conference Proceedings
4. Graft Copolymerization of Styrene onto Poly (vinyl) Chloride in a Supercritical Medium
Kwak, S. ; Trivedi, A.H. ; Lee, T.Y. ; Lee, S.
Pub. info.: AIChE 1993 ANNUAL MEETING - ST. LOUIS, MO - NOV. 7-12, 1993.  1993.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1993
5.

Conference Proceedings
Conference Proceedings
5. Experimental methodology of contact edge roughness on sub-100-nm pattern
Lee, T.Y. ; Ihm, D. ; Kang, H.C. ; Lee, J.B. ; Lee, B.-H. ; Chin, S.-B. ; Cho, D.-H. ; Kim, Y.H. ; Yang, H.D. ; Yang, K.M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.623-632,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
6.

Conference Proceedings
Conference Proceedings
6. Electrical defect SEM review under the various electric circumstances on SAC layer
Lee, T.Y. ; Whan, N.-K. ; Lee, B.H. ; Chin, S.-B. ; Cho, D.H. ; Choi, J.I. ; Hur, S.S. ; Ko, K.H. ; Yeo, J.-H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.859-864,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375