Lee, C. H. ; Han, S. ; Park, K. S. ; Kang, H. Y. ; Oh, H. W. ; Lee, J. E. ; Kim, K. M. ; Kim, Y. H. ; Kim, T. S. ; Oh, H.-K.
Pub. info.:
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.564-571, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, J. E. ; Hahn, C. A. ; Nam, S. -H. ; Wang, B. ; Reichard, K. ; Ditto, D. ; Glista, D. ; Wang, Q. ; Yin, S.
Pub. info.:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X. pp.52-63, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yin, S. ; Reichard, K. M. ; Lee, J. E. ; Chen, Q. ; Ditto, D. H. ; Mazurowski, J. ; Hackert, M. ; Zhang, Q.
Pub. info.:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII. pp.63140Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, J. E. ; Chen, Q. ; Yin, S. ; Lin, M. R. ; Zhang, Q. ; Reichard, K. M. ; Ditto, D. H. ; Mazurowski, J. ; Hackert, M.
Pub. info.:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII. pp.63141G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, C. H. ; Han, S. ; Park, K. S. ; Yoon, S. ; Kang, H. Y. ; Oh, H. W. ; Lee, J. E. ; Kim, Y. H. ; Kim, T. S. ; Oh, H.-K.
Pub. info.:
Photomask and Next-Generation Lithography Mask Technology XII. pp.749-756, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering