1.

Conference Proceedings
Conference Proceedings
1. Self-aligned microtool and electrochemical discharge machining (ECDM) for ceramic materials
Lim,H.-J. ; Lim,Y.-M. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.348-353,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. Multipoint process monitoring system based on an acousto-optic tunable filter (AOTF)
Kim,D. ; You,J.W. ; Kim,S.H. ; Kong,H.J. ; Lee,Y.W. ; Chegal,W. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.202-206,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
3.

Conference Proceedings
Conference Proceedings
3. In-situ single-wavelength ellipsometer for a vacuum chamber
Chegal,W. ; Ye,S. ; Cho,H.M. ; Lee,Y.W. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.15-18,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
4.

Conference Proceedings
Conference Proceedings
4. Accuracy enhancement of point triangulation probes for linear displacement measurement
Kim,K.-C. ; Kim,J.-A. ; Oh,S.-B. ; Kim,S. ; Kwak,Y.K.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.88-95,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
5.

Conference Proceedings
Conference Proceedings
5. Multi-degree-of-freedom displacement measurement system using a diffraction grating
Kim,J.-A. ; Kim,K.-C. ; Bae,E.W. ; Kim,S. ; Kwak,Y.K.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.150-157,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
6.

Conference Proceedings
Conference Proceedings
6. Micromotion measurement system for millistructure using diffraction grating
Bae,E.W. ; Kim,J.-A. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optomechatronic systems : 5-6 November 2000, Boston, USA.  pp.71-79,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4190
7.

Conference Proceedings
Conference Proceedings
7. New error-compensation method in a linear encoder using phase-shifted grating
Song,J.-H. ; Kim,K.-C. ; Kim,S.-H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.124-127,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
8.

Conference Proceedings
Conference Proceedings
8. Novel cross-correlation algorithm for reducing noise-related errors in array-type optical triangulation displacement sensors
Kim,K.-C. ; Oh,S.B. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Testing, Reliability, and Applications of Optoelectronic Devices.  pp.95-101,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4285
9.

Conference Proceedings
Conference Proceedings
9. Resolution enhancement using a diffraction grating for optical triangulation displacement sensors
Oh,S.B. ; Kim,K.-C. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Testing, Reliability, and Applications of Optoelectronic Devices.  pp.102-108,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4285