1.

Conference Proceedings
Conference Proceedings
1. The variation of microstructure in CZ silicon induced by low-high two step anneal
Kung, C.Y. ; Liu, J.M. ; Hsu, W. ; Horng, R.H.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.88-97,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. The Effect of the Nucleation Temperature on the Variation of the Nanostructure of Cz Silicon After Two-and-Three-Step Anneals
Kung, C.Y. ; Tsuy, F.C. ; Lee, H.M. ; Lee, S.C.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.290-299,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1