1.

Conference Proceedings
Conference Proceedings
1. Piezo-Spectroscopic Stress Measurement near PZT-Microstructures on Silicon
Krawietz,R. ; Pompe,W. ; Gerbatsch,A. ; Sergo,V. ; Ciaechi,L.C.
Pub. info.: Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998.  pp.211-214,  1998.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 287-288
2.

Conference Proceedings
Conference Proceedings
2. Investigation of thermal aging of Ni/C-multilayers by X-ray methods
Krawietz,R. ; Wehner,B. ; Sebald,T. ; Mai,H. ; Dietsch,R.
Pub. info.: EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria.  Part2  pp.331-336,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 166-169
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Ni/C Multilayers with Fluorescence XAFS Experinrents at Fixed Standing Wave Field Positions
Meyer,D.C. ; Holz,Th. ; Krawietz,R. ; Richter,K. ; Wehner,B. ; Paufler,P.
Pub. info.: European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995.  pp.511-516,  1996.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 228-231