Ascheron, C. ; Krause, R. ; Polity, A. ; Sobotta, H. ; Riede, V.
Pub. info.:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.1127-1132, 1992. Pittsburgh, Pa.. Materials Research Society
Zhou, S. ; Reynolds, P. ; Krause, R. ; Buma, T. ; O'Donnell, M. ; Hossack, J.A.
Pub. info.:
Medical Imaging 2003: Ultrasonic Imaging and Signal Processing. pp.78-85, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Conference Proceedings
