1.

Conference Proceedings

Conference Proceedings
Bruijn,M.P. ; Tiest,W.B. ; Hoevers,H.F.C. ; Kuur,J.van der ; Mels,W.A. ; Korte,P.A.J.de
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.145-153,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
2.

Conference Proceedings

Conference Proceedings
Korte,P.A.J.de ; Bavdaz,M. ; Duband,L. ; Holland,A.D. ; Peacock,A.J. ; StrOder,L.
Pub. info.: X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado.  pp.103-126,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3766
3.

Conference Proceedings

Conference Proceedings
Korte,P.A.J.de ; Hoevers,H.F.C. ; Bruijn,M.P. ; Bento,A.C. ; Mels,W.A. ; Bleeker,J.A.M. ; Holland,A.D. ; Turner,M.J.T.
Pub. info.: X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado.  pp.152-161,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3766
4.

Conference Proceedings

Conference Proceedings
Bootsma,T.M.V. ; Aarts,H.J.M. ; Berg,M.L.van den ; Brinkman,A.C. ; Boggende,A.J.F.den ; Herder,J.W.den ; Jong,L.de ; Korte,P.A.J.de ; Olsthoorn,S.M. ; Zwet,E.J.van ; Owens,A.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.481-491,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808
5.

Conference Proceedings

Conference Proceedings
Brinkman,A.C. ; Aarts,H.J.M. ; Boggende,A.J.F.den ; Bootsma,T.M.V. ; Dubbeldam,L. ; Herder,J.W.den ; Kaastra,J.S. ; Korte,P.A.J.de ; Leeuwen,B.J.van ; Mewe,R. ; Zwet,E.J.van ; Decker,T.A. ; Hailey,C.J. ; Kahn,S.M. ; Pratuch,S.M. ; Rasmussen,A. ; Branduardi-Raymont,G. ; Guttridge,P. ; Bixler,J.V.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.463-480,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808
6.

Conference Proceedings

Conference Proceedings
Korte,P.A.J.de ; Berg,M.L.van den ; Bruijn,M.P. ; Gomez,J. ; Kiewiet,F. ; Lieshout,H.L.van ; Luiten,O.J. ; Brons,C.G.S. ; Flokstra,J. ; Hamster,A.W.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.506-515,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808