1.

Conference Proceedings
Conference Proceedings
1. Deep-level defects in semi-insulating LT MBE GaAs
Kozlowski,R. ; Kaminski,P. ; Kordos,P. ; Pawlowski,M. ; Cwirko,R.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.203-207,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. Investigations of porous silicon layers with regard to chemical microsensor applications
Schoning,M.J. ; Crott,M. ; Ronkel,F. ; Thust,M. ; Schultze,J.W. ; Kordos,P. ; Luth,H.
Pub. info.: Third international conference on intelligent materials : third European conference on smart structures and materials, Lyon/3-4-5 June 1996, center of congress "L'Espace tete d'or".  pp.275-280,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2779
3.

Conference Proceedings
Conference Proceedings
3. Thin-film electrodes for trace metal analysis by dc resistance changes
Schoning,M.J. ; Gluck,O. ; Kordos,P. ; Luth,H. ; Emons,H.
Pub. info.: Chemical microsensors and applications II : 19-20 September 1999, Boston, Massachusetts.  pp.135-143,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3857