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Conference Proceedings
Conference Proceedings
1. SURFACE CONTAMINATION LEVEL OF GaAs WAFERS TREATED WITH SOLUTIONS OF ORGANIC BASE MEASURED BY TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF)
Shibaya, H. ; Kondo, H. ; Tomizawa, K.
Pub. info.: Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A..  pp.329-334,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 259
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Conference Proceedings
Conference Proceedings
2. Effect Of Hydrogen Radical On Properties Of Hydrogen In Hydrogenated Microcrystalline Silicon
Harada, H. ; Inouchi, H. ; Itoh, T. ; Kondo, H. ; Nitta, S. ; Nonomura, S. ; Yamamoto, K. ; Yamana, N. ; Yoshida, N.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A6.4-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
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Conference Proceedings
Conference Proceedings
3. Luminescence and Defect Formation under ArF Excimer Laser Light Irradiation in Alkali Iodide Crystals
Hashimoto, S. ; Ichimura, N. ; Kondo, H. ; Harada, Y.
Pub. info.: Proceedings of the International Conference on Excitonic Processes in Condensed Matter : EXCON '98.  pp.444-449,  1998.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-25
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Conference Proceedings
Conference Proceedings
4. Presence of Catalytic Activity of the Antibody Light Chain Raised against Complementarity Determining Region Peptide of Super Catalytic Antibody
Zhou, Y. ; Hifumi, E. ; Kondo, H. ; Uda, T.
Pub. info.: Biological systems engineering.  pp.200-209,  2002.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 830
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Conference Proceedings
Conference Proceedings
5. POINT DEFECT ASSISTED CRYSTAL GROWTH ON BULK ZnSe
Terashima, K. ; Tokizaki, E. ; Kondo, H. ; Tanigawa, S. ; Uedono, A ; Watauchi, S. ; Ujihira, Y.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.111-116,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
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Conference Proceedings
Conference Proceedings
6. AMORPHOUS Cu-Zr AND Fe-Ti COMPOSITIONALLY MODULATED FILMS PRODUCED BY SPUTTERING FROM ELEMENTAL TARGETS
Chason, E. ; Kondo, H. ; Mizoguchi, T. ; Cammarata, R.C. ; Spaepen, F. ; Window, B. ; Dunlop, J.B. ; Day, R.K.
Pub. info.: Rapidly solidified alloys and their mechanical and magnetic properties : symposium held December 2-4, 1985, Boston, Massachusetts, USA.  pp.69-74,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 58
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Conference Proceedings
Conference Proceedings
7. Simple and direct method for detecting phosphorus in air at normal pressure and temperature using a combination of LIBS and LIFS techniques
Al-Jeffery, M.O. ; Kondo, H. ; Belenkevitch, A. ; Azzeer, A.M.
Pub. info.: Optical biopsy IV : 21-23 January 2002, San Jose, USA.  pp.269-277,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4613
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Conference Proceedings
Conference Proceedings
8. Adsorption and Desorption of Contaminant Metals on Si Wafer Surface in SC1 Solution
Maeda, G. ; Takahashi, I. ; Kondo, H. ; Ryuta, J. ; Shingyouji, T.
Pub. info.: Ultraclean semiconductor processing technology and surface chemical cleaning and passivation : Symposum held April 17-19, 1995, San Francisco, California, USA.  pp.195-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 386
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Conference Proceedings
Conference Proceedings
9. Preliminary study on systematic optimization of EPL mask infrastructure
Takase, H. ; Gomei, Y. ; Terashima, S. ; Kondo, H. ; Aoki, T. ; Matsunari, S. ; Niibe, M. ; Kakutani, Y.
Pub. info.: Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA.  pp.509-517,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5751
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Conference Proceedings
Conference Proceedings
10. EPL performance in 65-nm node metallization technology and beyond
Kakutani, Y. ; Niibe, M. ; Takase, H. ; Terashima, S. ; Kondo, H. ; Matsunari, S. ; Aoki, T. ; Gomei, Y. ; Fukuda, Y.
Pub. info.: Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA.  pp.501-508,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5751