1.

Conference Proceedings
Conference Proceedings
1. Electromigration-Induced Failure as a Function of Via Interface
Kisselgof, Larisa ; Lloyd, J. R.
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.401-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473
2.

Conference Proceedings
Conference Proceedings
2. ELECTROMIGRATION LIFETIME AND STEP COVERAGE IN Al/Cu/Si THIN FILM CONDUCTORS
Kisselgof, Larisa ; Elliott, L. J. ; Maziarz, J. J. ; Lloyd, J. R.
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.107-112,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225