1.

Conference Proceedings
Conference Proceedings
1. Accuracy enhancement of point triangulation probes for linear displacement measurement
Kim,K.-C. ; Kim,J.-A. ; Oh,S.-B. ; Kim,S. ; Kwak,Y.K.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.88-95,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
2.

Conference Proceedings
Conference Proceedings
2. Multi-degree-of-freedom displacement measurement system using a diffraction grating
Kim,J.-A. ; Kim,K.-C. ; Bae,E.W. ; Kim,S. ; Kwak,Y.K.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.150-157,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
3.

Conference Proceedings
Conference Proceedings
3. Micromotion measurement system for millistructure using diffraction grating
Bae,E.W. ; Kim,J.-A. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optomechatronic systems : 5-6 November 2000, Boston, USA.  pp.71-79,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4190