1.

Conference Proceedings
Conference Proceedings
1. Exfoliation of Polypropylene/Clay Nanocomposites Under Electric Field (330)
Ahn,K.H. ; Kim,D.H. ; Park,J.U. ; Hong,J. ; Lee,S.J.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  2  pp.1457-1460,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
2.

Conference Proceedings
Conference Proceedings
2. Novel antireflective structure for metal layer patterning
Choi,S.-S. ; Cha,H.S. ; Kim,J.-S. ; Park,J.M. ; Kim,D.H. ; Lee,K.H. ; Ahn,J. ; Chung,H.B. ; Kim,B.W.
Pub. info.: Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California.  Part 1  pp.336-346,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3333
3.

Conference Proceedings
Conference Proceedings
3. Chromatic aberration-free TTL alignment system for 193-nm step-and-scan exposure system by using phase conjugate waves
Kwon,J.H. ; Sohn,Y.J. ; Hwang,H.C. ; Kim,D.H. ; Chung,H.B.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.971-977,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
4.

Conference Proceedings
Conference Proceedings
4. Design of illumination aperture for ArF exposure system with wide exposing latitude
Choi,S.-S. ; Cha,H.S. ; Kim,J.-S. ; Lee,K.H. ; Kim,D.H. ; Chung,H.B. ; Kim,D.Y.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.792-799,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679
5.

Conference Proceedings
Conference Proceedings
5. Alignment system for ArF excimer-laser-based step-and-scan system
Kim,D.H. ; Kim,J.S. ; Sohn,Y.J. ; Kwon,J.H. ; Lee,K.H. ; Choi,S.-S. ; Chung,H.B. ; Yoo,H.J. ; Kim,B.W.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.958-970,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
6.

Conference Proceedings
Conference Proceedings
6. Design of illumination system for ArF excimer laser step-and-scanner
Lee,K.H. ; Kim,D.H. ; Kim,J.S. ; Choi,S.-S. ; Chung,H.B. ; Yoo,H.J. ; Kim,B.W.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.997-1004,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
7.

Conference Proceedings
Conference Proceedings
7. An Identification Method for Complete Set of Complex-valued Piezoelectric Properties
Park,Y.S. ; Kim,D.H. ; Joh,C.Y.
Pub. info.: Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan.  pp.1251-1257,  1996.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2768
8.

Conference Proceedings
Conference Proceedings
8. Fuzzy logic genetic algorithm for hypercompression
Jannson,T. ; Kostrzewski,A.A. ; Ternovskiy,I.V. ; Kim,D.H.
Pub. info.: Applications of soft computing : 28-29 July 1997, San Diego, California.  pp.270-278,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3165
9.

Conference Proceedings
Conference Proceedings
9. Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
Cho,C.R. ; Noh,K.Y. ; Lee,D.H. ; Kim,Y.S. ; Ko,S.W. ; Kim,C.W. ; Kim,D.H. ; Son,C.B. ; Kim,S.J. ; Cho,D.H. ; Choi,J.J. ; Kim,D.J. ; Bae,K.M. ; Rozgonyi,G.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.201-208,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
10.

Conference Proceedings
Conference Proceedings
10. Optical packet header processing based on joint transform correlator
Kim,D.H. ; Kostrzewski,A.A. ; Ro,S. ; Savant,G.D. ; Vasiliev,A.A. ; Oh,T.K.
Pub. info.: Advances in optical information processing IX : 25-26 April 2000, Orlando, USA.  pp.140-146,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4046