1.

Conference Proceedings
Conference Proceedings
1. Sensitivity of an extrinsic Fabry-Perot interferometric sensor with respect to the alignment direction of the sensor for detecting lamb waves [6167-23]
Kim, D. -H. ; Kim, Y. -H. ; Kim, C.-G.
Pub. info.: Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA.  pp.61670P-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6167
2.

Conference Proceedings
Conference Proceedings
2. The location, structure and role of MoOx and MoCy species in Mo/H-ZSM5 catalysts for methane aromatization
Li, W. ; Meitzner, G. D. ; Kim, Y. -H. ; Borry, R. W. ; Iglesia, E.
Pub. info.: 12th International Congress on Catalysis : proceedings of the 12th ICC, Granada, Spain, July 9-14, 2000.  pp.3621-,  2000.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 130
3.

Conference Proceedings
Conference Proceedings
3. Performace analysis of wavelet based restoration for passive millimeter-wave images
Park, H. ; Kim, S. -H. ; Singh, M. K. ; Choi, J. -H. ; Lee, H. -J. ; Kim, Y. -H.
Pub. info.: Passive millimeter-wave imaging technology VIII : 30-31 March 2005, Orlando, Florida, USA.  pp.157-166,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5789
4.

Conference Proceedings
Conference Proceedings
4. Process Integration of Highly Stable 1.25um2 6T-SRAM Cell with 45 nm Gate Length Triple Gate Transistors
Lee, K. ; Yang, J. -H. ; Maeda, S. ; Jin, Y.- S. ; Choi, J. -A. ; Bae, S. -G. ; Kim, Y. -H. ; Ahn, J. -H. ; Sun, M. -C. ; Ku, J. -H. ; Rhee, H. -S. ; You, Y. -S. ; Kim, J. -Y. ; Nam, B. -Y. ; Kang, C. -J.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.16-31,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
5.

Conference Proceedings
Conference Proceedings
5. AN ADHESION STYDY OF COPPER AND CHROMIUM FILMS TO POLYIMIDE
Chung, T. G. ; Yu, Jin ; Kim, Y. -H. ; Ahn, E. C. ; Park, I. S.
Pub. info.: Electronic packaging materials science VII : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A..  pp.377-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 323
6.

Conference Proceedings
Conference Proceedings
6. Evaluation of the attenuated PSM performance as the shifter transmittance and illumination systems
Kim, Y. -H. ; Park, J. -H. ; Lee, K. -H. ; Choi, S. -W. ; Yoon, H. -S. ; Sohn, J. -M.
Pub. info.: Photomask and X-Ray Mask Technology VI.  pp.332-339,  1999.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3748
7.

Conference Proceedings
Conference Proceedings
7. Reticle haze measurement by spectroscopic elipsometry [5992-156]
Kim, Y. -H. ; Kim, S. -J. ; Park, J. -B. ; Jung, M. -L. ; Kim, S. -H. ; Park, S. -W. ; Kyoung, J. -S. ; An, I. -S. ; Oh, S. -K.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59924L-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
8.

Conference Proceedings
Conference Proceedings
8. Concentrating partial entanglement of two photons via entanglement swapping (Invited paper) [6305-33]
Hwang, M.-J. ; Kim, Y. -H.
Pub. info.: Quantum Communications and Quantum Imaging IV.  pp.63050U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6305