1.

Conference Proceedings
Conference Proceedings
1. New Poly(2,5-dimercapto-1,3,4-thiadiazole) and Poly(aniline) Co-Intercalated V2O5 Nanocomposite Materials for Rechargeable Lithium Battery
Park, N.-G. ; Kim, K.-M. ; Ryu, K.S. ; Park, Y.-J. ; Kang, S.-G. ; Kim, D.-K. ; Chang, S.-H.
Pub. info.: Rechargeable lithium batteries : proceedings of the international symposium.  pp.99-105,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-21
2.

Conference Proceedings
Conference Proceedings
2. High Pull Speed for Fast Pulled Crystal in Cz Growth
Oh, H.J. ; Wang, J.H. ; Kim, K.-M. ; Yoo, H.-D.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.44-53,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings
Conference Proceedings
3. A 2.5 Gb/s CMOS optical transceiver with 10: 1 serializer using clock generation and delayed data topology [6124-50]
Kim, K.-M. ; Kang, H -W ; Kim, D -G ; Moon, Y T ; Choi, Y -W
Pub. info.: Optoelectronic Integrated Circuits VIII.  pp.61241G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6124
4.

Conference Proceedings
Conference Proceedings
4. An electrical model of VCSEL as optical transmitter for optical printed circuit board
Kim, D.-K. ; Yoon, Y.-S. ; Choi, J.-H. ; Kim, K.-M. ; Choi, Y.-W. ; Lee, S.
Pub. info.: Optoelectronic Integrated Circuits VII.  pp.316-324,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5729
5.

Conference Proceedings
Conference Proceedings
5. Influence of activation energy on LER in chemically amplified KrF photoresists
Kim, J.H. ; Lee, C.H. ; Park, S.B. ; Kim, W.M. ; Moon, S.S. ; Kim, K.-M. ; Lee, S.Y. ; Yoon, S. ; Kim, Y.H. ; Chon, S.-M.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.790-800,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
6.

Conference Proceedings
Conference Proceedings
6. Comprehensive analysis of sources of total CD variation in ArF resist perspective
Kim, H.-W. ; Lee, H.-R. ; Kim, K.-M. ; Lee, S.Y. ; Kim, B.-C. ; Oh, S.-H. ; Woo, S.-G. ; Cho, H.-K. ; Han, W.-S.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.254-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
7.

Conference Proceedings
Conference Proceedings
7. Influence of resin properties to resist performance at ArF lithography
Yoon, S. ; Kim, M. ; Lee, H. ; Kim, D.Y. ; Kim, Y.H. ; Kim, B.D. ; Kim, J.H. ; Kim, K.-M. ; Lee, S.Y. ; Chon, S.-M.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.583-590,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
8.

Conference Proceedings
Conference Proceedings
8. Impact of BARC on SEM shrinkage of ArF resist
Lee, S.Y. ; Kim, M. ; Yoon, S. ; Kim, K.-M. ; Kim, J.H. ; Kim, H.-W. ; Woo, S.-G. ; Kim, Y.H. ; Chon, S.-M. ; Kishioka, T. ; Sone, Y. ; Nakajima, Y.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.575-582,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376