1.

Conference Proceedings

Conference Proceedings
Han, S.-J. ; Kim, B.-H. ; Park, J.-H. ; Kim, Y.-H. ; Choi, S.-W. ; Han, W.-S
Pub. info.: Advanced microlithography technologies : 8-10 November, 2004, Beijing, China.  pp.109-113,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5645
2.

Conference Proceedings

Conference Proceedings
Ahn, T.-J. ; Kim, B.-H. ; Lee, B.H. ; Chung, Y. ; Paek, U.-C.T. ; Han, W.-T.
Pub. info.: APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina.  pp.154-161,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4579
3.

Conference Proceedings

Conference Proceedings
Yun, J.-H. ; Kim, H.-S. ; Jung, S.-W. ; Jung, E. J. ; Kim, B.-H. ; Choi, G. H. ; Kim, S. T. ; Chung, U-In. ; Moon, J.-T.
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.577-584,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-05
4.

Technical Paper

Technical Paper
Kim, B.-H. ; Williams, D.R. ; Emo, S. ; Acharya, M.
Pub. info.: AIAA paper.  2002.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Aerodynamic Measurement Technology and Ground Testing Conference
Ser. no.: 2002
5.

Conference Proceedings

Conference Proceedings
Kim, M.-S. ; Park, J.-H. ; Kim, H.-J. ; Kim, I.-H. ; Jeon, J.-H. ; Gil, M.-G. ; Kim, B.-H.
Pub. info.: Advances in Resist Technology and Processing XIX.  Part Two  pp.761-772,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4690
6.

Conference Proceedings

Conference Proceedings
Shim, K.-C. ; Kim, M.-S. ; Lee, E.-S. ; Lee, C.-S. ; Gil, M.-G. ; Kim, B.-H. ; In, J.-S. ; Yoon, T.-B. ; Kim, J.-S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.919-926,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689
7.

Conference Proceedings

Conference Proceedings
Shin, J.H. ; Cho, K.-S. ; Jhe, J.-H. ; Sung, G.Y. ; Kim, B.-H. ; Park, S.-J.
Pub. info.: Quantum Sensing and Nanophotonic Devices.  pp.31-39,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5359
8.

Conference Proceedings

Conference Proceedings
Kim, B.-H. ; Song, T.-K.
Pub. info.: Medical Imaging 2004: Ultrasonic Imaging and Signal Processing.  pp.315-323,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5373
9.

Conference Proceedings

Conference Proceedings
Park, N.-M. ; Kim, T.-Y. ; Kim, S.H. ; Sung, G.Y. ; Kim, B.-H. ; Park, S.-J. ; Cho, K.S. ; Shin, J.H. ; Lee, J.-K. ; Nastasi, M.
Pub. info.: Quantum Dots, Nanoparticles, and Nanoclusters.  pp.60-65,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5361