1.

Conference Proceedings
Conference Proceedings
1. Synchrotron x-ray study of multilayers in Laue geometry
Kang, H.C. ; Stephenson, G.B. ; Liu, C. ; Conley, R. ; Macrander, A.T. ; Maser, J. ; Bajt, S. ; Chapman, H.N.
Pub. info.: X-ray sources and optics : 2-3 August 2004, Denver, Colorado, USA.  pp.127-132,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5537
2.

Conference Proceedings
Conference Proceedings
2. Multilayer Laue lenses as high-resolution x-ray optics (Invited Paper)
Maser, J. ; Stephenson, G.B. ; Vogt, S. ; Yun, W. ; Macrander, A. ; Kang, H.C. ; Liu, C. ; Conley, R.
Pub. info.: Design and microfabrication of novel x-ray optics II : 5-6 August 2004, Denver, Colorado, USA.  pp.185-194,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5539
3.

Conference Proceedings
Conference Proceedings
3. Quantitative Analysis of Precipitation Behavior in Ferrite of V Added Microalloyed Steel
Kang, H.C. ; Lee, S.H. ; Shin, D.H. ; Lee, K.J. ; Kim, S.J. ; Lee, K.S.
Pub. info.: Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003.  pp.49-52,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 449-452
4.

Conference Proceedings
Conference Proceedings
4. Experimental methodology of contact edge roughness on sub-100-nm pattern
Lee, T.Y. ; Ihm, D. ; Kang, H.C. ; Lee, J.B. ; Lee, B.-H. ; Chin, S.-B. ; Cho, D.-H. ; Kim, Y.H. ; Yang, H.D. ; Yang, K.M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.623-632,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375