1.

Conference Proceedings

Conference Proceedings
John,J. ; Zimmermann,L. ; Nemeth,S. ; Colin,T. ; Merken,P. ; Borghs,S. ; Hoof,C.A.Van
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.692-697,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings

Conference Proceedings
Zogg,H. ; Fach,A. ; John,J. ; Muller,P. ; Paglino,C.
Pub. info.: Infrared detectors for remote sensing : physics, materials, and devices : 8-9 August 1996, Denver, Colorado.  pp.42-45,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2816
3.

Conference Proceedings

Conference Proceedings
Hans Zogg ; John,J. ; Tiwari,A.M. ; Alchalabi,K.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.768-773,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
4.

Conference Proceedings

Conference Proceedings
Moor,P.De ; John,J. ; Sedky,S. ; Hoof,C.A.Van
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.27-34,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
5.

Conference Proceedings

Conference Proceedings
Zogg,H. ; Fach,A. ; John,J. ; Muller,P. ; Paglino,C. ; Tiwari,A. N.
Pub. info.: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.26-29,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3182
6.

Conference Proceedings

Conference Proceedings
Merken,P. ; Moor,P.De ; John,J. ; Zimmermann,L. ; Gastal,M. ; Jain,S.C. ; Hoof,C.Van
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part1  pp.19-25,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
7.

Conference Proceedings

Conference Proceedings
Hoof,C.A.Van ; Zimmermann,L. ; John,J. ; Moor,P.De ; Kavadias,S. ; Gastal,M. ; Nemeth,S. ; Borghs,G. ; Merken,P.
Pub. info.: Fifth international conference on material science and material properties for infrared optoelectronics : 22-24 may 2000, Kiev, Ukraine.  pp.23-31,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4355
8.

Conference Proceedings

Conference Proceedings
Merken,P. ; Zimmermann,L. ; John,J. ; Nemeth,S. ; Gastal,M. ; Borghs,G. ; Hoof,C.A.Van
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.246-251,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
9.

Conference Proceedings

Conference Proceedings
Zimmermann,L. ; John,J. ; Weerd,M.de ; Slaman,M. ; Nemeth,S. ; Merken,P. ; Borghs,S. ; Hoof,C.A.Van
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.77-84,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
10.

Conference Proceedings

Conference Proceedings
Venkataraghavan,R. ; Karmakar,B. ; Gokhale,M.R. ; Chandrasekaran,K.S. ; John,J. ; Lokhre,S.G. ; Arora,B.M.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.1057-1060,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975