1.

Conference Proceedings
Conference Proceedings
1. Fabrication and performance characteristics of high-speed ion-implanted Si metal-semiconductor-metal photodetectors
Dutta,N.K. ; Nichols,D.T. ; Jacobson,D.C. ; Livescu,G.
Pub. info.: Photodetectors : materials and devices : 1-2 February 1996.  pp.150-158,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2685
2.

Conference Proceedings
Conference Proceedings
2. Diffusion of gold in amorphous silicon
Frank,W. ; Gustin,W. ; Coffa,S. ; Poate,J.M. ; Jacobson,D.C.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.203-208,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Spontaneous Emission Control In Planar Structures: Er3+In Si/SO2 Microcavities
Hunt,N.E.J. ; Vredenberg,A.M. ; Schubert,E.F. ; Becker,P.J. ; Jacobson,D.C. ; Poate,J.M. ; Zydzik,G.J.
Pub. info.: Confined electrons and photons : new physics and applications.  pp.715-728,  1995.  New York.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 340
4.

Conference Proceedings
Conference Proceedings
4. The Physics and Application of Si:Er for Light Emitting Diodes
Michel,J. ; Ren,F.Y.G. ; Zheng,B. ; Jacobson,D.C. ; Poate,J.M. ; Kimerling,L.C.(invited)
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.707-714,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings
Conference Proceedings
5. Dopant enhancement of the 1.54ｦﾌm emission of erbium implanted in silicon
Michel,J. ; Kimerling,L.C. ; Benton,J.L. ; Eaglesham,D.J. ; Fitzgerald,E.A. ; Jacobson,D.C. ; Poate,J.M. ; Xie,Y.-H. ; Fer-rante,R.F.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.653-658,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87