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Conference Proceedings
C. F. Chiu ; C. L. Chen ; J. W. Lee ; W. B. Wu ; C. L. Shih ; F. Y. Chen ; J. P. Lin
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Optical microlithography XX . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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6520
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H. Hamwi ; J. W. Lee ; K. R. Hoffmann ; S. Rudin ; A. Verevkin
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Medical imaging 2008 . 3 pp.69133T-1-69133T-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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6913
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Conference Proceedings
S. H. Lee ; J. W. Kim ; S. K. Oh ; C. S. Park ; J. Y. Lee ; S. S. Kim ; J. W. Lee ; D. Kim ; J. Kim ; K. D. Ban ; C. K. Bok ; S. C. Moon
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Advances in resist materials and processing technology XXIV . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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6519
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S. S. Kim ; J. W. Kim ; J. Y. Lee ; S. K. Oh ; S. H. Lee ; J. W. Lee ; D. bae Kim ; J. Kim ; K. D. Ban ; C. K. Bok ; S. Moon
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Advances in resist materials and processing technology XXIV . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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6519
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Conference Proceedings
J. R. Sherman ; H. S. Rangwala ; C. N. lonita ; A. C. Dohatcu ; J. W. Lee
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Medical imaging 2008 . 2 pp.69181V-1-69181V-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
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6918