1.

Conference Proceedings
Conference Proceedings
1. Sensitivity analysis of a photonic crystal structure for index-of-refraction sensing
Progress in biomedical optics and imaging. vol.8, no.24
Pub. info.: Nanoscale imaging, spectroscopy, sensing, and actuation for biomedical applications IV : 23-24 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6447
2.

Conference Proceedings
Conference Proceedings
2. Terahertz wave generation in orientation-patterned GaAs using resonantly enhanced schemes
K. L. Vodopyanov ; J. E. Schaar ; P. S. Kuo ; M. M. Fejer ; X. Yu ; J. S. Harris ; V. G. Kozlov ; D. F. Bliss ; C. Lynch
Pub. info.: Nonlinear frequency generation and conversion : materials, devices, and applications VI : 23-24 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6455
3.

Conference Proceedings
Conference Proceedings
3. High-intensity bowtie nano-aperture vertical-cavity surface-emitting laser for ultrahigh-density near-field optical data storage
Z. Rao ; L. Hesselink ; J. S. Harris
Pub. info.: Optical Data Storage 2007 : 20-23 May 2007, Portland, Oregon, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6620
4.

Conference Proceedings
Conference Proceedings
4. GaInNAsSb/GaAs vertical cavity surface-emitting lasers (VCSELs): current challenges and techniques to realize multiple-wavelength laser arrays at 1.55 µm
M. Gobet ; H. P. Bae ; T. Sarmiento ; J. S. Harris
Pub. info.: Vertical-cavity surface-emitting lasers XII : 23-24 January 2008, San Jose, California, USA.  pp.69080N-1-69080N-11,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6908