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15 results

Conference Proceedings

1. Characterization of the monochromatic laser Compton x-ray beam with picosecond and femtosecond pulse widths

Endo,A. ; Takasago,K. ; Ito,S. ; Yang,J. ; Yanagida,T. ; Okada,Y. ; Yorozu,M. ; Sakai,F.

Pub. info.:	Advances in laboratory-based X-ray sources and optics II : 30 July-1 August 2001, San Diego, USA. pp.100-108, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4502

Conference Proceedings

2. Femtosecond optical Kerr shutter switching in glass containing high concentration of Bi2O3

Sugimoto,N. ; Ito,S. ; Fujiwara,S. ; Suzuki,T. ; Kanbara,H. ; Hirao,K.

Pub. info.:	Applications of photonic technology 3 : closing the gap between theory, development, and application. pp.24-28, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3491

Conference Proceedings

3. 512 x 512-element GeSi/Si heterojunction infrared FPA

Wada,H. ; Nagashima,M. ; Hayashi,K. ; Nakanishi,J. ; Kimata,M. ; Kumada,N. ; Ito,S.

Pub. info.:	Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida. pp.584-595, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3698

Conference Proceedings

4. High-accuracy development monitoring technology

Ito,S. ; Hayasaki,K. ; Kawano,K. ; Sho,K. ; Mimotogi,S. ; Komatsu,F. ; Okumvra,K.

Pub. info.:	In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland. pp.142-150, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3743

Conference Proceedings

5. Laser synchrotron femtosecond x-ray source for novel imaging

Endo,A. ; Kobayashi,K. ; Takasago,K. ; Ito,S. ; Yang,J. ; Okada,Y. ; Yorozu,M. ; Sakai,F. ; Aoki,Y.

Pub. info.:	Advances in laboratory-based X-ray sources and optics : 31 July-1 August 2000, San Diego, USA. pp.16-25, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4144

Conference Proceedings

6. PtSi Schottky-barrier infrared FPAs with CDS readout (Invited Paper)

Kimata,M. ; Ozeki,T. ; Nunoshita,M. ; Ito,S.

Pub. info.:	Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland. pp.212-223, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3179

Conference Proceedings

7. PtSi Schottky-barrier infared focal plane arrays (Invited Paper)

Kimata,M. ; Ozeki,T. ; Tsubouchi,N. ; Ito,S.

Pub. info.:	Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China. pp.2-12, 1998. Bellingham. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3505

Conference Proceedings

8. Yield management by threshold voltage adjustment in back-end process (Invited Paper)

Ito,S. ; Noguchi,K. ; Horiuchi,T.

Pub. info.:	Microelectronic device technology II : 23-24 September, 1998, Santa Clara, California. pp.184-191, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3506

Technical Paper

9. A Flat Plate Solar Collector with Dual Channels for Air Flows

Ito,S. ; Kashima,M. ; Miura,N.

Pub. info.:	A collection of technical papers : 35th intersociety energy conversion engineering conference & exhibit (IECEC), Las Vegas, Nevada, 24 July - 28 July 2000. v. 1 pp.148-153, 2000. [Reston, VA]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Intersociety Energy Conversion Engineering Conference and Exhibit (IECEC)
Ser. no.:	2000

10.

Technical Paper

10. Rolling Contact Fatigue Test with Large-Sized Specimen

Maeda,K. ; Nakashima,H. ; Kashimura,H. ; Tsushima,N. ; Ito,S.

Pub. info.:	Bearing technology : analysis, development, and testing. pp.47-54, 1985. "Society of Automotive Engineering, Inc."
Title of ser.:	SAE special publication
Ser. no.:	SP-628

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