1.

Conference Proceedings
Conference Proceedings
1. Field Dependence of Thermal Emission from Oxygen in GaP
Qurashi,U.S. ; Iqbal,M.Zafar ; Baber,N.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.923-928,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings
Conference Proceedings
2. Photoluminescence from Silver-Related Defects in Silicon
Iqbal,M.Zafar ; Davies,G. ; Lightowlers,E.C.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.773-774,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Influence of Al Doping on Deep Levels in MBE GaAs
Qurashi,U.S. ; Iqbal,M.Zafar ; Baber,N. ; Andersson,T.G.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1767-1772,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201