1.

Conference Proceedings
Conference Proceedings
1. THE EFFECTS OF LIGHT AND ELECTRICAL STRESS ON ASYMMETRIC a-Si TFT
Oh, C.R. ; Chung, I.J. ; Kim, W.Y. ; Hwang, J.R. ; Lee, S.K. ; Kim, Y.S. ; Park, J.S. ; Han, M.K.
Pub. info.: Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A..  pp.419-424,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 284
2.

Conference Proceedings
Conference Proceedings
2. EXTRACTION OF ALTERED LOCALIZED-STATES IN a-Si AND POLY-Si TFT’s UNDER VARIOUS CONDITIONS
Hwang, J.R. ; Park, J.S. ; Jun, M.C. ; Jang, J. ; Han, M.K.
Pub. info.: Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A..  pp.913-918,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 297
3.

Conference Proceedings
Conference Proceedings
3. A NEW MODEL FOR SERIES RESISTANCE OF AMORPHOUS SILICON THIN FILM TRANSISTOR
Kim,Y.S. ; Park, J.S. ; Lee, S.K. ; Hwang, J.R. ; Choi, H.S. ; Choi, Y.I. ; Han, M.K.
Pub. info.: Amorphous silicon technology, 1992.  pp.991-996,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 258
4.

Conference Proceedings
Conference Proceedings
4. EFFECTS OF ULTRAVIOLET RADIATION ON THE CHARACTERISTICS OF HYDROGENATED AMORPHOUS SILICON THIN FILM TRANSISTORS
Lee, S.K. ; Park, J.S. ; Kim, Y.S. ; Hwang, J.R. ; Oh, C.H. ; Han, M.K.
Pub. info.: Amorphous silicon technology, 1992.  pp.967-972,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 258
5.

Technical Paper
Technical Paper
5. System Dynamics and Ride Quality Assessment of Automobile.
Lin, K.Y. ; Hwang, J.R. ; Chang, S.H. ; Fung, C.P. ; Chang, J.M.
Pub. info.: 2006 SAE world congress : technical paper.  2006.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2006
6.

Conference Proceedings
Conference Proceedings
6. Compensation of resist trim process and polygate plasma microloading effect for lithography process window and CD uniformity improvement
Lee, K.M. ; Fan, C.W. ; Hwang, J.R. ; Liu, C.C. ; Hung, K.C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.1007-1016,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689