1.

Conference Proceedings
Conference Proceedings
1. Line end design intent estimation using curves
Hung, C. -Y. ; Gao, G. ; Zhang, S. ; Deng, Z. -X. ; Cork, C. ; Melvin III, L. S. ; Jiang, Y.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.413-418,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
2.

Conference Proceedings
Conference Proceedings
2. Growth of GaAs and InAlAs on High Quality, Epitaxial, NiAl Metal Film
Hung, C. -Y. ; Weckwerth, M. V. ; Visokay, M. R. ; Pao, Y. C. ; Harris, J. S., Jr.
Pub. info.: Evolution of epitaxial structure and morphology : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.537-,  1996.  Pittsburgh, Pennsylvania.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 399
3.

Conference Proceedings
Conference Proceedings
3. Simulation-based scattering bar generation for 65nm and beyond [5992-173]
Hung, C. -Y. ; Liu, Q. ; Zhang, L.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.599252-599252,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
4.

Conference Proceedings
Conference Proceedings
4. Integrated post tape outflow for fast design to mask turn-around time [5992-172]
Hung, C. -Y. ; Liu, Q. ; Zhang, L. ; Shang, S. ; Bailey, G. E. ; Jost, A. ; Brist, T.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.599251-599251,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
5.

Conference Proceedings
Conference Proceedings
5. First 65-nm tape-out using inverse lithography technology (ILT) [5992-67]
Hung, C. -Y. ; Zhang, B. ; Tang, D. ; Guo, E. ; Pang, L. ; Liu, Y. ; Moore, A. ; Wang, K.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59921U-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
6.

Conference Proceedings
Conference Proceedings
6. Model-based DRC for design and process integration [5992-122]
Hung, C. -Y. ; Jost, A. M. ; Liu, Q.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59923M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
7.

Conference Proceedings
Conference Proceedings
7. Formation and verification of a 90-nm contact lumped model
Hung, C. -Y. ; Zhang, B. ; Wang, Y. D.
Pub. info.: 24th Annual BACUS Symposium on Photomask Technology.  pp.1349-1355,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5567