1.

Conference Proceedings
Conference Proceedings
1. TEM Investigation of Point Defect Interactions in II-VI Compounds
Loginov,Y.Y. ; Brown,P.D. ; Humphreys,C.J.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1461-1466,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Observation of 3-Fold Periodicity in 3C-SiC Layers Grown by MBE
Kaiser,U. ; Brown,P.D. ; Chuvilin,A. ; Khodos,I. ; Fissel,A. ; Richter,W. ; Preston,A. ; Humphreys,C.J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.259-262,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. A Correlation between Compositional Fluctuations and Surface Undulations in Strained Layer Epitaxy
Walther,T. ; Humphreys,C.J. ; Cullis,A.G. ; Robbins,D.J.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.505-510,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201