1.

Conference Proceedings
Conference Proceedings
1. Characterization of CaF2 substrates for VUV fluoride coatings
Hultaker, A. ; Gliech, S. ; Gessner, H. ; Duparre, A.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.119-126,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
2.

Conference Proceedings
Conference Proceedings
2. Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter
Flemming, M. ; Hultaker, A. ; Reihs, K. ; Duparre, A.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.56-63,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
3.

Conference Proceedings
Conference Proceedings
3. VUV light scattering measurements of substrtes and thin film coatings
Hultaker, A. ; Gliech, S. ; Benkert, N. ; Duparre, A.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.115-122,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
4.

Conference Proceedings
Conference Proceedings
4. Electrical and optical properties of thin films prepared by spin coating a dispersion of nano- sized tin-doped indium-oxide particles
Ederth, J. ; Hultaker, A. ; Heszler, P. ; Niklasson, G.A. ; Granqvist, C.G. ; van Doorn, A.K. ; van Haag, C. ; Jongerius, M.J. ; Burgard, D.
Pub. info.: BioMEMS and smart nanostructures : 17-19 December 2001, Adelaide, Australia.  pp.280-285,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4590
5.

Conference Proceedings
Conference Proceedings
5. 157- and 193-nm scatter, R, and T measurement technique
Gliech, S. ; Gessner, H. ; Hultaker, A. ; Duparre, A.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.137-145,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
6.

Conference Proceedings
Conference Proceedings
6. Dielectric characterization of thin films consisting of tin doped indium oxide nanoparticles
Hultaker, A. ; Niklasson, G. A.
Pub. info.: Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.491-,  2000.  Pittsburgh, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 581
7.

Conference Proceedings
Conference Proceedings
7. Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter
Hultaker, A. ; Benkert, N. ; Gliech, S. ; Duparre, A.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.444-451,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932