1.

Conference Proceedings
Conference Proceedings
1. Whole-field digital vibrometer system for buried landmine detection
Lal, A. ; Hess, C. ; Scott, E. ; Dang, M. ; Nichols, R.
Pub. info.: Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA.  pp.665-674,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5794
2.

Conference Proceedings
Conference Proceedings
2. Prediction of Residual Strength of Laminated Composites Subjected to Low Velocity Impact
Thao, Y. ; Hess, C. ; Hill, E. ; Wang, C.S.
Pub. info.: ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004.  pp.1369-1373,  2004.  Brookfield Center, Conn..  Society of Plastics Engineers
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 62
3.

Conference Proceedings
Conference Proceedings
3. Implementation of reflected light die-to-die inspection and ReviewSmart to improve 65nm DRAM mask fabrication [5992-09]
Kim, D. Y. ; Cho, W. I. ; Park, J. H. ; Chung, D. H. ; Cha, B. C. ; Choi, S. W. ; Han, W. S. ; Park, K. H. ; Kim, N. W. ; Hess, C. ; Ma, W. ; Kim, D.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.599209-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
4.

Conference Proceedings
Conference Proceedings
4. New die-to-database inspection algorithm for inspection of 90-nm node reticles
Garcia, H.I. ; Volk, W.W. ; Watson, S. ; Hess, C. ; Aquino, C. ; Wiley, J. ; Mack, C.A.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.364-374,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
5.

Conference Proceedings
Conference Proceedings
5. Reverse engineering by fringe projection
Burke, J. ; Bothe, T. ; Osten, W. ; Hess, C.
Pub. info.: Interferometry XI: Applications.  pp.312-324,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4778
6.

Conference Proceedings
Conference Proceedings
6. Investigation of smart inspection of critical layer reticles using additional designer data to determine defect significance
Volk, W.W. ; Hess, C. ; Ruch, W. ; Yu, Z. ; Ma, W. ; Fisher, L. ; Vickery, C. ; Ma, Z.M.
Pub. info.: 23rd Annual BACUS Symposium on Photomask Technology.  pp.489-499,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5256