1.

Conference Proceedings
Conference Proceedings
1. In-line phase contrast in synchrotron-radiation microradiography and tomography
Weitkamp,T. ; Rau,C. ; Snigirev,A.A. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Schroer,C.G.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.92-102,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
2.

Conference Proceedings
Conference Proceedings
2. Magnified hard x-ray microtomography: toward tomography with submicron resolution
Schroer,C.G. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Rau,C. ; Weitkamp,T. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.23-33,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
3.

Conference Proceedings
Conference Proceedings
3. Tomography with high resolution
Rau,C. ; Weitkamp,T. ; Snigirev,A.A. ; Schroer,C.G. ; Benner,B. ; Tummler,J. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Krill Ⅲ,C.E. ; Dobrich,K.M. ; Michels,D. ; Michels,A.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.14-22,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
4.

Conference Proceedings
Conference Proceedings
4. Microbeam production using compound refractive lenses: beam characterization and applications
Schroer,C.G. ; Lengeler,B. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Simionovici,A.S. ; Bohic,S. ; Drakopoulos,M. ; Snigirev,A.A. ; Snigireva,I. ; Schroder,W.H.
Pub. info.: X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA.  pp.52-63,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4499
5.

Conference Proceedings
Conference Proceedings
5. High-resolution element mapping inside biological samples using fluorescence microtomography
Schroer,C.G. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Schroder,W.H. ; Kuhn,A.J. ; Simionovici,A.S. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.230-239,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
6.

Conference Proceedings
Conference Proceedings
6. Fluorescence microtomography: external mapping of elements inside biological samples
Schroer,C.G. ; Tummler,J. ; Gunzler,T.F. ; Lengeler,B. ; Schroder,W.H. ; Kuhn,A.J. ; Simionovici,A.S. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Penetrating Radiation Systems and Applications II.  pp.287-296,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4142