Glembocki, O. J. ; Dagata, J. A. ; Dobisz, E. A. ; Katzer, D. S.
Pub. info.:
Photons and low energy particles in surface processing : symposium held Decmber[i.e. December] 3-6, 1991, Boston, Massachusetts, U.S.A.. pp.217-222, 1992. Pittsburgh, Pa.. Materials Research Society
Nanomaterial synthesis and integration for sensors, electronics, photonics, and electro-optics : 1-4 October, 2006, Boston, Massachusetts, USA. pp.63700Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Glembocki, O. J. ; Tuchman, J. A. ; Ko, K. K. ; Pang, S. W. ; Giordana, A. ; Stutz, C. E.
Pub. info.:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.153-, 1994. Pittsburgh. MRS - Materials Research Society
Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A.. pp.117-, 1999. Warrendale, PA. MRS - Materials Research Society
Eddy, C. R., Jr. ; Leonhardt, D. ; Shamamian, V. A. ; Holm, R. T. ; Glembocki, O. J. ; Meyer, J. R. ; Hoffman, C. A. ; Butler, J. E.
Pub. info.:
Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. pp.275-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.247-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Grun, J. ; Manka, C. K. ; Hoffman, C. A. ; Meyer, J. R. ; Glembocki, O. J. ; Qadri, S. B. ; Skelton, E. F. ; Donnelly, D. ; Covington, B.
Pub. info.:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.395-, 1998. Warrendale, Pa. MRS - Materials Research Society