1.

Conference Proceedings

Conference Proceedings
Madejczyk,P. ; Rutkowski,J. ; Gawron,W. ; Kubiak,L. ; Wenus,J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.357-362,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Gawron,W. ; Adamiec,K. ; Larkowski,W.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.281-285,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
3.

Conference Proceedings

Conference Proceedings
Rutkowski,J. ; Wenus,J. ; Gawron,W. ; Adamiec,K.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.310-315,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
4.

Conference Proceedings

Conference Proceedings
Gawron,W. ; Rutkowski,J. ; Raczyriska,J. ; Adamiec,K. ; Larkowski,W.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.316-320,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
5.

Conference Proceedings

Conference Proceedings
Gawron,W. ; Adamiec,K. ; Jozwikowski,K. ; Rogalski,A.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.94-103,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
6.

Conference Proceedings

Conference Proceedings
Piotrowski,J. ; Grudzien,M. ; Nowak,Z. ; Orman,Z. ; Pawluczyk,J. ; Romanis,M. ; Gawron,W.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.175-184,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
7.

Conference Proceedings

Conference Proceedings
Adamiec,K. ; Rutkowski,J. ; Rogalski,A. ; Gawron,W. ; Wenus,J. ; Larkowski,W.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.382-388,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
8.

Conference Proceedings

Conference Proceedings
Gawron,W. ; Adamiec,K. ; Rogalski,A.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.354-361,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
9.

Conference Proceedings

Conference Proceedings
Adamiec,K. ; Gawron,W. ; Piotrowski,J.
Pub. info.: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.251-255,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3179