1.

Conference Proceedings
Conference Proceedings
1. Microregion stress measurement of wafer
Ni,S.Y. ; Shi,H.M. ; Fu,L. ; Lu,Y.D.
Pub. info.: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.321-324,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4537
2.

Conference Proceedings
Conference Proceedings
2. High-sensitivity detection of capillary electrophoresis with multiphoton excitation
Fu,L. ; Lu,Q. ; Chen,H. ; Chen,T. ; Zeng,S. ; Luo,Q.
Pub. info.: International Workshop on Photonics and Imaging in Biology and Medicine : 8-10 October 2001, Wuhan, China.  pp.266-272,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4536
3.

Conference Proceedings
Conference Proceedings
3. Measuring rotation angles in high speed with laser interference
Fan,Z. ; Xu,S. ; Long,F. ; Fu,L. ; Li,C.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.53-57,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
4.

Conference Proceedings
Conference Proceedings
4. Electron response characteristics of PSD and applications
Fu,L. ; Li,Y. ; Jiang,D. ; Lu,Y. ; Tian,J. ; Wang,G.
Pub. info.: Fiber optic sensors V : 6-7 November 1996, Beijing, China.  pp.548-551,  1996.  Bellingham, Wash. USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2895
5.

Conference Proceedings
Conference Proceedings
5. Intermixing effect in quantum well infrared detector
Lu,W. ; Li,N. ; Zhang,L.F. ; Shen,S.C. ; Fu,Y. ; Willander,M. ; Fu,L. ; Tan,H.H. ; Jagadish,C.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.348-352,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
6.

Conference Proceedings
Conference Proceedings
6. Wavelength tuning of GaAs/AlGaAs quantum well infrared photodetectors by rapid thermal annealing and proton implantation
Li,N. ; Liu,X. ; Lu,W. ; Yuan,X.Z. ; Shen,S.C. ; Tan,H.H. ; Fu,L. ; Jagadish,C.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.151-154,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
7.

Conference Proceedings
Conference Proceedings
7. Use of ion implantation for the creation of ultrafast photodetector materials and tuning of quantum well infrared photodetectors
Tan,H.H. ; Fu,L. ; Carmody,C.Y. ; Jagadish,C.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.47-55,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
8.

Conference Proceedings
Conference Proceedings
8. Deformation measurement of high-power laser resonator mirrors using 2D shearing interferometer
Fu,L. ; Shi,H. ; Ni,S. ; Lu,Y. ; Zhang,L. ; Xin,J.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.15-18,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
9.

Conference Proceedings
Conference Proceedings
9. Surface emitter in near UV: study on metallic film
DuanMu,Q. ; Tian,J. ; Li,Y. ; Jiang,D. ; Lu,Y. ; Fu,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.327-329,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings
Conference Proceedings
10. Diagnostics for femtosecond and nanosecond laser-ablation discharge plasmas as used in thin film growth
Zhang,Z. ; VanRompay,P.A. ; Nees,J.A. ; Stewart,C.A. ; Pan,X.Q. ; Fu,L. ; Pronko,P.P.
Pub. info.: Laser plasma generation and diagnostics : 27 January 2000, San Jose, California.  pp.86-96,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3935