Pelfer, P. G. ; Dubecky, F. ; Fornari, R. ; Pikna, M. ; Krempasky, M. ; Gombia, E. ; Darmo, J. ; Mosca, R. ; Sekacova, M.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.477-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Avella, M. ; Jimenez, J. ; Fornari, R. ; Puente, E. de la
Pub. info.:
Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.111-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Jimenez, J. ; Fornari, R. ; Curti, M. ; Puente, E. de la ; Avella, M. ; Sanz, L. F. ; Gonzalez, M. A. ; Alvarez, A.
Pub. info.:
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.625-, 1998. Pittsburgh, PA. MRS - Materials Research Society
Uecker, R. ; Klimm, D. ; Ganschow, S. ; Reiche, P. ; Bertram, R. ; Roβberg, M. ; Fornari, R.
Pub. info.:
Optically Based Materials and Optically Based Biological and Chemical Sensing for Defence II. pp.599006-599006, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering