1.

Conference Proceedings

Conference Proceedings
Bussjager, R. ; Erdmann, R. ; Kovanis, V. ; McKeon, B. ; Fanto, M. ; Johns, S. ; Hayduk, M. ; Osman, J. ; Morrow, A. ; Green, M. ; Stoffel, N. ; Tan, S. ; Shick, C. ; Bacon, W. ; Beaman, B.
Pub. info.: Enabling photonics technologies for defense, security, and aerospace applications II : 20-21 April 2006, Kissimmee, Florida, USA.  pp.62430J-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6243
2.

Conference Proceedings

Conference Proceedings
Wabnitz, H. ; Moller, M. ; Liebert, A. ; Walter, A. ; Erdmann, R. ; Raitza, O. ; Drenckhahn, C. ; Dreier, J. P. ; Obrig, H. ; Steinbrink, J. ; Macdonald, R.
Pub. info.: Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany.  pp.58590H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5859
3.

Conference Proceedings

Conference Proceedings
Wahi, M. ; Ortmann, U. ; Lauritsen, K. ; Erdmann, R.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.171-178,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648
4.

Conference Proceedings

Conference Proceedings
Koberling, F. ; Wahl, M. ; Patting, M. ; Rahn, H.-J. ; Kapusta, P. ; Erdmann, R.
Pub. info.: Novel optical instrumentation for biomedical applications : 24-25 June 2003, Munich, Germany.  pp.181-192,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5143
5.

Conference Proceedings

Conference Proceedings
Wahl, M. ; Rahn, H.-J. ; Ortmann, U. ; Erdmann, R. ; Boehmer, M. ; Enderlein, J.
Pub. info.: Methods for ultrasensitive detection ll : 21-22 January 2002, San Jose, USA.  pp.104-111,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4634
6.

Conference Proceedings

Conference Proceedings
Haring, R. ; Schmitt, T. ; Belldncdurt, A.-R. ; Lison, F. ; Lauritsen, K. ; Erdmann, R. ; Kaenders, W.
Pub. info.: Solid State Lasers XIV: Technology and Devices.  pp.302-308,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5707
7.

Conference Proceedings

Conference Proceedings
Erdmann, R. ; Langkopf, M. ; Lauritsen, K. ; Bulter, A. ; Wahl, M. ; Wabnitz, H. ; Liebert, A. ; Moller, M. ; Schmitt, T.
Pub. info.: Optical Tomography and Spectroscopy of Tissue VI.  pp.43-50,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5693
8.

Conference Proceedings

Conference Proceedings
Kramer, B. ; Koberling, F. ; Ortmann, U. ; Wahl, M. ; Kapusta, P. ; Bulter, A. ; Erdmann, R.
Pub. info.: Multiphoton Microscopy in the Biomedical Sciences V.  pp.138-143,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5700
9.

Conference Proceedings

Conference Proceedings
Dertinger, T. ; Koberling, F. ; Benda, A. ; Erdmann, R. ; Hof, M. ; Enderlein, J.
Pub. info.: Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III.  pp.219-226,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5699
10.

Conference Proceedings

Conference Proceedings
Ortmann, U. ; Dertinger, T. ; Wahl, M. ; Patting, M. ; Erdmann, R.
Pub. info.: Optical Diagnostics and Sensing IV.  pp.179-186,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5325